Associate Director for Microscopy Faculty

We are seeking a high-level electron microscopist who will provide scientific support to the Materials Characterization Processing (MCP) Core Facility in the Department of Materials Science and Engineering (DMSE), Whiting School of Engineering. The position represents the lead electron microscopist for the Center for Intelligent Microscopy -- a Center of Excellence in partnership with JEOL Ltd. focused on integration of AI/ML with cutting edge stimulus, controls and automation platforms in TEM and SEM.

The position will report to the Executive Director of the MCP and will involve outward facing activities with the broader Johns Hopkins University (JHU), including the School of Medicine, as well as the international electron microscopy community. This is a non-tenure track faculty position of the DMSE funded at 100% FTE.

The successful candidate will work closely with the director of facilities to establish the two new JEOL TEMs, a Grand ARM II and a F200, both equipped with EELS, dual EDS, precession electron diffraction, direct electron detectors, IDES laser and beam manipulation, in situ holders, tomography and cryo-He holder. These scopes are in the brand new state-of-the-art MCP facility in the historic Stieff Silver Building in Baltimore.

The MCP is a fully integrated facility designed for automated environmental lab control to guarantee machine performance, and full high-speed data connectivity at the instrument to cross-campus levels. We are looking for a microscopist who will help define how microscopy is done in the future. There will also be plenty of opportunities to participate in cutting edge university, government and industry research.

• A PhD in Materials Science, Physics, Chemistry, Chemical Engineering, or related field with several years' experience with aberration-corrected microscopy
• Extensive knowledge in:
  • Atomic resolution imaging (HRTEM and STEM) and 4-D imaging methods
  • Electron diffraction analysis, including scanning precession electron diffraction
  • Analytical transmission electron microscopy tools, including EELS and EDS
• Working knowledge of:
  • Electron tomography and in situ/operando sample holders
  • Scanning electron microscopy and focused ion beam
  • Desire and ability to teach microscopy techniques and theory to students, faculty and other researchers
  • Ability to interface with other staff toward interdisciplinary technical goals

• Be the main TEM microscopist responsible for maintaining, operating and training of the JEOL scopes
• Interface with JEOL service and scientists in developing EDGE computing, AI and ML advancements
• Guide and support research directions in TEM applications with faculty, students and external users
• Collaborate with or support users from JHU, external universities, government, and industry in ongoing projects.
• Guide and mentor new users and students in expanding their knowledge
• Oversee demonstrations, workshops, etc.

• Collaborate as Co-PI on grants
• Participate in the national and international microscopy community
• Other professional development opportunities

Salary: $110,000 - $170,000

Applicants should submit a curriculum vitae, a research statement, a teaching statement, three recent publications, and complete contact information for at least three references. Review of applications will begin in mid-January 2025.

Job Type: Full Time

The listed salary range represents the minimum and maximum Johns Hopkins University offers for this position, based on a good faith estimate at the time of posting. Actual compensation will vary depending on factors such as location, skills, experience, market conditions, education, and internal equity. Not all candidates will qualify for the highest salary in the range.

Johns Hopkins provides a comprehensive benefits package supporting health, career, and retirement. Learn more: .

All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, gender identity, national origin, disability, or status as a protected veteran.

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