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DM- Product Test Technician - C shift

Job in Dallas, Dallas County, Texas, 75215, USA
Listing for: Texas Instruments
Full Time position
Listed on 2026-10-11
Job specializations:
  • Manufacturing / Production
    Production QC/QA, Quality Engineering, Test Engineer
Salary/Wage Range or Industry Benchmark: 65000 - 90000 USD Yearly USD 65000.00 90000.00 YEAR
Job Description & How to Apply Below
Position: DM5 - Product Test Technician - C shift

Change the world. Love your job.
Texas Instruments is looking for a skilled Parametric Test Technician to join our team. This technician will be an invaluable part of the team, interfacing and communicating with engineering and manufacturing groups across the fab to ensure all issues are solved appropriately and efficiently.
Additionally, you will provide process and product support to the organization and address production concerns and disposition of production material. As a product technician in one of our clean rooms, you will provide technical support for a specific product or group of products, from product definition and planning through production and release. Once the product is on the line, you will monitor and audit line operators, and offer guidance.
Responsibilities include:

  • Manage, troubleshoot and improve parametric test programs used in the production environment
  • Evaluate test program issues; recommend and implement improvements
  • Technical evaluation and disposition of manufacturing lots on the probe floor
  • Review wafer maps from probed wafers to identify yield issues, report on the issues seen, and ink wafer maps as necessary
  • Support the test floor as the first line of defense for testing issues
  • Monitor the test floor continuously to address hardware issues, test program issues, prober device file issues, old/hold lots and misprocesses
  • Support all engineering test program requests
  • Support maintenance and troubleshoot probe cards that go down
  • Support reliability (bake) testing, such as VSM, 100% probing, DPSE, and SPSE (prebake test, bake, and post bake-test)
  • Create TSK prober device files for new devices at each test log point for Parametric probing
  • Disposition all lots at data review log points quickly and precisely, and identify correct re-probe and scrap requirements
  • Update and send out inline data log reports about group of lots that have failed testing
  • Disposition wafers that failed to process in Axcelis UV Erase tool, due to errors
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