PhD in Amplitude and Phase Control Optical Metrology

Delft University of Technology
· Faculty of Applied Sciences

Netherlands

Delft University of Technology is recruiting a PhD candidate to develop amplitude- and phase-controlled optical metrology for nanoscale semiconductor manufacturing. Applications close on 15 October 2026 at 23:59 Europe/Amsterdam.

The project develops coherent optical scatterometry methods with full control of the input probe field. It combines first-principles optical modelling, electromagnetic scattering, signal processing, optimisation and machine-learning methods to improve retrieval of nanoscale shape and overlay information.

optical metrology scatterometry semiconductor manufacturing electromagnetic scattering machine learning

Level PhD

Time Commitment Full-time

Duration 4 years; initial 1.5-year contract followed by 2.5 years after a positive go/no-go assessment

Reference Code 3752

Field Optical Metrology and Coherent Scatterometry

Specialization Physics

Organization Type University

Funding & Compensation

Amount EUR  / Per Month

Funding Type Salary

Funding Status Paid

Period Per Month

Applicants should hold an MSc in applied physics, electrical engineering or an equivalent relevant field.

Applicants should have strong theoretical foundations and demonstrable interest in optics, electromagnetic scattering, signal processing and mathematics, together with willingness to work on both theory and experiments.

• Optical metrology
• Coherent scatterometry
• Electromagnetic scattering
• Signal processing
• Optimization
• Machine learning
• Scientific programming

• Teamwork
• Scientific communication
• Continuous learning
• Research integrity