Senior Electron Microscopy Engineer: Defect & FIB/TEM Expert
Listed on 2026-10-30
-
Engineering
Electronics Engineer, Quality Engineering
Applied Optoelectronics, Inc. (AOI) seeks a Senior Electron Microscopy Engineer to drive advanced microscopy for semiconductor laser failure analysis and yield improvement.
The candidate will lead expert analyses using FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction, with emphasis on defect formation and process origins. The role requires deep crystallography knowledge, hands-on FIB sample prep, and the ability to connect microscopy observations to device performance and
We would love to welcome a new Senior Electron Microscopy Engineer:
Defect & FIB/TEM Expert to our group in TX, United States.
Learn more about the Senior Electron Microscopy Engineer:
Defect & FIB/TEM Expert role in the description above.
We appreciate your interest in this position.
Join Instruct-ERIC and contribute to our ongoing work.
Take a moment to read everything above and see whether this role is right for you.
(If this job is in fact in your jurisdiction, then you may be using a Proxy or VPN to access this site, and to progress further, you should change your connectivity to another mobile device or PC).