Nano-Scale Planar Metrology Scientist; X-ray
Listed on 2026-10-20
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Science
Research Scientist -
Research/Development
Research Scientist
The Material Measurement Laboratory at the National Institute of Standards and Technology (NIST) seeks qualified U.S. citizens to join a team within the CHIPS Nanometer-Scale Planar Reference Materials project.
You will apply advanced X-ray and optical metrology to map properties of thin films on Si and SiC wafers. The position, for one year with renewal options, involves developing structural maps, performing sample preparation, and publishing results in journals.
The Nano-Scale Planar Metrology Scientist (X-ray) position in the Bio & Pharmacology & Health field is open for applications.
We are seeking a motivated Nano-Scale Planar Metrology Scientist (X-ray) to join National Institute of Standards and Technology in Gaithersburg, MD, United States.
Consider building your career as a Nano-Scale Planar Metrology Scientist (X-ray) at National Institute of Standards and Technology.
We have an opening for a Nano-Scale Planar Metrology Scientist (X-ray) in Gaithersburg, MD, United States within Bio & Pharmacology & Health.
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