Materials Scientist, FIB Analysis

Company Description Eurofins EAG Laboratories has over 40 years experience in engineering and materials testing services. Our parent company, Eurofins Scientific, is a multi-billion-dollar global leader in engineering and scientific services operating over 950 labs in 60 countries with 65,000 employees with a portfolio of over 200,000 validated analytical methods. At EAG, curiosity fuels everything we do. Every analysis, every test, and every question asked in our labs helps unlock what materials and products are capable of—and what the world can build next.

If you’re energized by materials science, analytical chemistry, engineering rigor, and solving problems that matter, you’ll feel right at home here.

Our scientists and engineers support industries ranging from semiconductors and advanced electronics to pharmaceuticals, medical devices, energy systems, and consumer products. Using advanced techniques in analytical chemistry, microscopy, surface analysis, and engineering sciences, we help clients solve complex challenges across the product lifecycle.

What sets EAG apart isn’t just our world‑class instrumentation—it’s our people. We’re problem solvers, collaborators, and lifelong learners who value precision, curiosity, and impact. Here, your work directly influences the safety, reliability, and performance of products used around the globe.

Imagine the possibilities. Let’s explore them together.

Job Description We're seeking a skilled Scientist with expertise in Dual Beam FIB/SEM technology to play a critical role in advanced microscopy investigations. Join our innovative Dual Beam Analysis team, where you'll work with state-of-the-art microscopy tools to support imaging and materials analysis of client  this role, you'll prepare high-quality TEM lamella, perform SEM imaging and EDS analysis on FIB cross-sections to support detailed structural, compositional, and failure analysis for clients across diverse industries.

You'll also contribute to critical dimension (CD) measurements, process optimization, and work closely with cross-functional teams to deliver timely analytical results for a wide range of semiconductor and materials characterization projects. The ideal candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast-paced laboratory environment, and takes pride in delivering results for clients.

What You'll DoSupport FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.

Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross-sectioning, and imaging.

Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.

Perform image processing and analysis on 2D/3D FIB/SEM datasets.

Improve throughput, repeatability, and data quality of Dual Beam services.

Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.

Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.

Work Schedule
* 5pm-2am, Tuesdays to Saturdays (
* Night Shift differential will apply)
Compliance Requirement (ITAR)
This position supports work subject to U.S. export control regulations.
Applicants must meet U.S. Person status as defined by ITAR:

U.S. CitizenU.S. Permanent Resident (Green Card)
Qualifications MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.

Must have in-depth knowledge of electron microscopy;
Dual Beam (FIB/SEM) imaging.

Expert with SEM/EDX, or TEM sample preparation.

Solid understanding of semiconductor device physics and failure analysis (through previous work experience…