Principal R&D Scientist

Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading-edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Our breadth of offerings across the entire semiconductor value chain helps our customers solve their most difficult yield, device performance, quality, and reliability issues.

Onto Innovation strives to optimize customers’ critical path of progress by making them smarter, faster and more efficient.

Job Summary & Responsibilities Position Summary We are seeking a highly motivated X-Ray expert to conduct advanced X-Ray research supporting the development of next-generation metrology solutions for semiconductor manufacturing. The scientist will perform X-Ray experiments, collect and analyze measurement data, develop theoretical models, and create physics-based and machine learning algorithms for microelectronics and advanced-material characterization.

The research will focus on developing and optimizing advanced X-Ray metrology techniques, including X-Ray diffraction (XRD), X-Ray reflectivity (XRR), X-Ray fluorescence (XRF), and critical-dimension small-angle X-Ray scattering (CD-SAXS). CD-SAXS will be a primary area of emphasis, with the goal of enabling accurate and precise structural, compositional, and dimensional characterization of semiconductor structures, thin films, and advanced materials.

The successful candidate will work at the intersection of experimental science, computational modeling, data analytics, and machine learning. This position requires strong technical independence, attention to experimental details, and the ability to communicate research results effectively to technical stakeholders.

Key Responsibilities Data collection and Hardware management

Execute routine alignment and maintenance of X-Ray metrology equipment, develop calibration methods and procedures to maintain measurement accuracy.

Coordinate and perform data collection on standard reference samples and engineering samples.

Conduct Gauge Repeatability and Reproducibility (Gauge R&R) testing, qualify tool stability and quantify measurement short- and long-term precision.

Design and test measurement recipes and optimize collection strategies for high throughput, and signal-to-noise ratio.

Data Analysis and Algorithm Development Develop and refine physical models with rigorous electromagnetic methods to fit X-Ray data, solve inverse- problem to extract thickness, composition, critical dimensions (CD), tilt, recess, shape factors, local structural variations, and other parameters of interest for microelectronics devices.

Develop and optimize Machine Learning and AI-based data analysis algorithms to accelerate data inversion and enhance the robustness of microelectronics characterization.

Process datasets using statistical software/libraries (e.g., Python, MATLAB, JMP) to identify process trends, anomalies, and correlation with reference techniques (TEM, AFM, CD-SEM etc.).Establish error budgets and uncertainty estimation to validate the limits of detection and quantification of the metrology system.

Documentation and Stakeholder Collaboration Meet and present research findings and milestones to stakeholders within and outside Onto Innovation.

Generate weekly work summaries and detailed technical reports, white papers and presentations summarizing metrology capability findings.

Deliver technical transfer packages with data analysis algorithm design and requirements to product and software engineering teams to transition research…