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Ultrafast optical characterization of defects in two dimensional semiconductors - _CDR_DFIS_

Job in Town of Italy, Penn Yan, Yates County, New York, 14527, USA
Listing for: Politecnico di Milano
Full Time position
Listed on 2026-01-12
Job specializations:
  • Research/Development
    Research Scientist, Data Scientist, Research Assistant/Associate, Research Analyst
Salary/Wage Range or Industry Benchmark: 60000 - 80000 USD Yearly USD 60000.00 80000.00 YEAR
Job Description & How to Apply Below
Position: Ultrafast optical characterization of defects in two dimensional semiconductors - 2025_CDR_DFIS_3
Location: Town of Italy

Organisation/Company Politecnico di Milano Research Field Physics Researcher Profile Recognised Researcher (R2) Leading Researcher (R4) First Stage Researcher (R1) Established Researcher (R3) Country Italy Final date to receive applications 8 Jan 2026 - 12:00 (UTC) Type of Contract To be defined Job Status Not Applicable Is the job funded through the EU Research Framework Programme? Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure?

No

Offer Description

The research program involves the static and transient characterization of defects induced in two-dimensional semiconductors using hyperspectral microscopy techniques and time-resolved optical spectroscopy.

  • quality, originality, and innovation of the research proposal, with reference to the research program covered by this selection (up to 20 points)
  • relevance and significance of previous research activities and professional experience in relation to the research program (up to 20 points)
  • relevance of submitted publications with respect to the research program (up to 20 points)
  • interview, aimed at assessing the candidate’s research aptitude, their ability to implement the proposed project, and their knowledge of English and/or other relevant languages for the research (up to 40 points)
  • EUROPE
Eligibility of fellows: country/ies of residence:
  • All
Eligibility of fellows: nationality/ies:#J-18808-Ljbffr
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