Testing & Metrology SME

Overview

Systems Planning and Analysis, Inc. (SPA) delivers high-impact, technical solutions to complex national security issues. With over 50 years of business expertise and consistent growth, we are known for continuous innovation for our government customers, in both the US and abroad. Our exceptionally talented team is highly collaborative in spirit and practice, producing Results that Matter. Come work with the best!

We offer opportunity, unique challenges, and clear-sighted commitment to the mission. SPA:
Objective. Responsive. Trusted.

The Joint, Office of the Secretary of Defense, Interagency Division (JOID) provides expert support services to a range of customers spanning across the Department of Defense, Federal Civilian, and international markets. JOID provides a diverse portfolio of analytical and programmatic capabilities to help our customers make informed decisions on their most challenging issues.

The Critical Infrastructure Group (CIG) within JOID provides technical, programmatic, and analytical support to customers with missions in national security such as the Department of Homeland Security (DHS) and the Department of Commerce. CIG specializes in supporting major national security initiatives by leveraging expertise in countering weapons of mass destruction, critical infrastructure protection, emergency response, nuclear non-proliferation, and advanced technologies.

We have an upcoming need for a Testing & Metrology Subject Matter Expert (SME) to support the National Institute of Standards and Technology’s (NIST) CHIPS R&D Office and efforts to develop a National semiconductor capability. This position will operate out of Northern Virginia in support of customers in the Washington DC Metropolitan region.

The Testing & Metrology SME will play a critical role in advancing the National Semiconductor Technology Center (NSTC) mission under the CHIPS Act by providing technical expertise in the science of measurement and testing as applied to semiconductor manufacturing processes. This position will focus on supporting the CHIPS Broad Agency Announcement (BAA) process, offering comprehensive expertise through technical requirement development, review and assessment of BAA responses, feedback and award recommendations, and oversight of organizations performing under BAA awards.

The role also involves providing long-term strategic planning, analysis, and advisory services for initiatives where testing and metrology are key components.

Specific responsibilities include:

• Technical Leadership for CHIPS Act Initiatives:
  Provide expertise in semiconductor metrology to guide the development of technical requirements and evaluation criteria for BAA-related efforts. Apply detailed technical analysis during the BAA response review process to ensure alignment with national semiconductor objectives.
• Oversight and Assessment:
  Monitor, assess, and advise on performance and deliverables from organizations awarded under the CHIPS BAA. Provide evidence-based recommendations for ensuring program milestones and objectives are met.
• Testing and Metrology Expertise:
  Apply advanced knowledge of semiconductor metrology, including critical dimension measurement, defect detection, and process control, to support initiatives aimed at strengthening domestic semiconductor manufacturing capabilities.
• Planning and Analytical Support:
  Offer technical insights to inform long-term planning for semiconductor R&D initiatives. Provide expertise to identify growth opportunities and integrate innovative testing and metrology solutions in support of emerging semiconductor technologies.
• Cross-Agency
  
  Collaboration:
  
  Collaborate with industry experts, academic institutions, and Federal partners to identify technical gaps, optimize measurement standards, and advance metrology innovation in domestic semiconductor manufacturing.
• Semiconductor Manufacturing Focus:
  Develop and support metrology applications specific to semiconductor fabrication processes, ensuring alignment with national goals related to precision, accuracy, quality control, and yield optimization.
• Policy and Initiative Guidance:
  Assist in shaping policy recommendations and forward-looking initiatives where metrology and testing science are critical enablers of technical progress.

Required:

• Advanced degree (Master’s or PhD) in Engineering, Physics, Material Science, Semiconductor Technology, or a related technical field.
• 8+ years of experience in testing, metrology, and calibration processes with direct application to semiconductor manufacturing or nanotechnology industries.
• Deep technical expertise in metrology techniques, including critical dimension measurement, thin-film characterization, defect detection, and real-time process control.
• Extensive experience supporting Federal-level programs, particularly R&D initiatives with technical evaluation and oversight components.
• Proven ability to apply metrology principles to improve manufacturing yield and quality…