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DFT Tech Lead

Job in Austin, Travis County, Texas, 78716, USA
Listing for: Retym, Inc
Full Time position
Listed on 2026-05-23
Job specializations:
  • Engineering
    Test Engineer, Electronics Engineer, Systems Engineer, Software Engineer
Salary/Wage Range or Industry Benchmark: 60000 - 80000 USD Yearly USD 60000.00 80000.00 YEAR
Job Description & How to Apply Below

We are looking for a talented and experienced DFT Tech Lead.

As a DFT Tech Lead you will work closely with all other design teams – backend, VLSI, verification and analog, fully responsible for defining, implementing, and deploying advanced design‑for‑test (DFT) methodologies for highly complex digital and mixed‑signal chips. You will define silicon test strategies, DFT/DFD architecture, and create DFT and Debug specifications for complex next generation SoCs.

Minimum Qualifications
  • 8+ years of experience in DFT specification definition, architecture, insertion, and analysis in designs
  • Experience in silicon bring‑up, debug, and validation of DFT features on ATE, debugging ATPG patterns, compressed ATPG patterns, MBIST, and JTAG‑related issues
  • Experience in fault modeling
Preferred Qualifications
  • Master's degree in Electrical Engineering.
  • Experience in IP integration (memories, Test controllers, TAP, MBIST).
  • Experience using EDA Test tools like Design/Fusion Compiler, DFT Max, Spy Glass, Modus, Tessent, and Test Kompress.
  • Experience and understanding of ASIC DFT, synthesis, simulation and verification flow.
  • Excellent attention to detail, organizational, problem‑solving, and communication skills.
Responsibilities
  • Create SoC DFT strategy and architecture (ATPG/DFT/MBIST)
  • Work on hierarchical design
  • Debug all Design Rule checks, apply design fixes to achieve high test quality
  • Insert all DFT logic – boundary scan, scan chains, DFT compression, Logic BIST, TAP controller, Clock Control block, and other DFT IP blocks.
  • Insert and hook up MBIST logic.
  • Define test plan for special analog IPs and implement.
  • Document DFT architecture and test sequences, including boot‑up sequence associated with test pins.
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