Postdoctoral Fellow; PREP

Overview

PREP Research Associate — CHIPS Funded Project. This position is part of the National Institute of Standards (NIST) Professional Research Experience (PREP) program. NIST recognizes that its research staff may wish to collaborate with researchers at academic institutions on specific projects of mutual interest, thus requires that such institutions must be the recipient of a PREP award. The PREP program requires staff from a wide range of backgrounds to work on scientific research in many areas.

Employees in this position will perform technical work that underpins the scientific research of the collaboration.

Materials Research Scientist (CHIPS Project: Nanometer-Scale Planar Reference Materials)

The candidate will join a team of researchers working with advanced metrology methods to characterize, local physical and chemical properties and map any variation in these properties of thin, nanometer-scale films (oxides, nitrides, carbides, germinides) deposited on Si and SiC wafers. The candidate will plan and conduct research using X-ray reflectivity, X-ray fluorescence spectroscopy, and X-ray photoelectron spectroscopy to determine through hybrid metrology, open-source, analysis methods, structural maps for wafers with thin films of essential interest to the semiconductor community.

• Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers.
• Use X-ray characterization methods, such as X-ray reflectivity, X-ray fluorescence, X-ray photoelectron spectroscopy, to determine the structural properties of thin film samples.
• Use open-source (Python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as a Research Grade Test Material to pair with the previously-determined digital wafer model.
• Publish results in refereed scientific journals and present results at conferences and meetings.

• PhD in physics, materials science, or another related field
• Background in X-ray measurement technique(s) required, either: X-ray reflectivity, X-ray fluorescence, or X-ray photoelectron spectroscopy