Postdoctoral Fellow; PREP

Research Title

Nanometer-Scale Planar Reference Materials (U.S. Citizens Preferred)

• Plan and conduct research on advanced X‑ray metrologies to determine structural (physical and chemical) properties of blanket thin films on Si and SiC wafers.
• Use lab‑based and synchrotron X‑ray characterization methods to determine structural properties of thin‑film samples.
• Use open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and combine properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as research‑grade test materials.
• Publish results in archival scientific journals and present at topical meetings.

• Ph.D. in physics, materials science, or related field.
• Background in X‑ray measurement technique(s) required, e.g., X‑ray reflectivity, X‑ray fluorescence, or X‑ray photoelectron spectroscopy.
• Background in programming and/or data modeling using Python is recommended.
• Familiarity with thin‑film deposition and clean‑room access protocols is preferred.
• Strong oral and written communication skills.

The referenced salary range represents the minimum and maximum salaries for this position and is based on Johns Hopkins University’s good faith belief at the time of posting. The actual compensation offered may vary and will ultimately depend on multiple factors, including the successful candidate’s geographic location, skills, work experience, internal equity, market conditions, education/training, and other factors, as reasonably determined by the University.

The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students. To that end, the university does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status or other legally protected characteristics. The university is committed to providing qualified individuals access to all academic and employment programs, benefits and activities on the basis of demonstrated ability, performance and merit without regard to personal factors or demographic characteristics that are irrelevant to the program involved.