Associate Director for Microscopy
Listed on 2026-06-05
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Science
Research Scientist
General Description
We are seeking a high‑level electron microscopist to provide scientific support to the Materials Characterization Processing (MCP) Core Facility in the Department of Materials Science and Engineering (DMSE) at the Whiting School of Engineering. The position leads electron microscopy for the Center for Intelligent Microscopy—a Center of Excellence in partnership with JEOL Ltd. focused on integrating AI/ML with cutting‑edge stimulus, controls and automation platforms in TEM and SEM.
The microscopist will report to the Executive Director of MCP and engage with the broader Johns Hopkins University community, including the School of Medicine and the international electron microscopy community. This non‑tenure track faculty position is fully funded at 100% FTE.
Working closely with facilities, the microscopist will establish two new JEOL TEMs—a Grand ARM II and an F200—both equipped with EELS, dual EDS, precession electron diffraction, direct electron detectors, IDES laser and beam manipulation, in‑situ holders, tomography and a cryo‑He holder. These state‑of‑the‑art scopes are housed in the new MCP facility within the historic Stieff Silver Building in Baltimore. The MCP is fully integrated with automated environmental lab control, guaranteeing machine performance, and offers high‑speed data connectivity from instrument to campus levels.
The microscopist will help define future microscopy practices and will have ample opportunities to participate in cutting‑edge university, government, and industry research.
Basic Qualifications or Specialized Certifications
- A PhD in Materials Science, Physics, Chemistry, Chemical Engineering, or a related field with several years’ experience with aberration‑corrected microscopy.
- Extensive knowledge of atomic‑resolution imaging (HRTEM and STEM) and 4‑D imaging methods, electron diffraction analysis—including scanning precession electron diffraction—and analytical TEM tools, including EELS and EDS.
- Working knowledge of electron tomography and in‑situ/operando sample holders, scanning electron microscopy, and focused ion beam.
- Desire and ability to teach microscopy techniques and theory to students, faculty, and other researchers.
- Ability to interface with other staff toward interdisciplinary technical goals.
- Be the main TEM microscopist responsible for maintaining, operating, and training users of the JEOL scopes.
- Interface with JEOL service and scientists to develop EDGE computing, AI, and ML advancements.
- Guide and support research directions in TEM applications for faculty, students, and external users.
- Collaborate with or support users from JHU, external universities, government, and industry in ongoing projects.
- Guide and mentor new users and students to expand their knowledge.
- Oversee demonstrations and workshops.
- Collaborate as Co‑PI on grants.
- Participate in the national and international microscopy community.
- Other professional development opportunities.
The referenced salary range represents the minimum and maximum salaries for this position and is based on Johns Hopkins University's good faith belief at the time of posting. Not all candidates will be eligible for the upper end of the salary range. The actual compensation offered to the selected candidate may vary and will ultimately depend on multiple factors, which may include the successful candidate's geographic location, skills, work experience, internal equity, market conditions, education/training and other factors, as reasonably determined by the University.
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