Applications Scientist Onto Innovation

The position reports to the Applications Manager and will be basedin

Boise .

• The new hire will have the opportunity to work closely with process engineers in semiconductor fabs to develop metrology solutions for complex multi-layer, optical critical dimension (scatterometry), and overlay measurements forstate-of-the-art memories devices. Duties will include applications development and characterization ofcutting-edge measurement technologies,creating technology/product presentations, and providing technical training for customers.
• Support the Micron Account activity in Boise, .
• Work with Application Manager to provide comprehensive application support to our current installed base and future installations.
• Interface with customers to highlight application opportunities and possibilities to strengthen ONTO position in the market.
• Perform on-site toolqualificationto achievecustomersspecifications.
• Build andoptimizescatterometry and ellipsometry models for both Thin Film and OCD applications to support Micron TD and HVM metrology team
• Travel toHQ for training, summit, and workshops, and travel to other customer sites toassistshareexperiencetolocal team and customers, and support tool and layer adoptions
• Collect future development feedback from the field and dispense it to our engineering&marketing group for future development to improve ONTO position within the market.

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