Metrology Application Engineer

Overview

Our vision to transform how the world uses information to enrich life for all. Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever. Micron Idaho Semiconductor Manufacturing (Triton) LLC.

Own research, development, and maintenance for internal metrology application and work closely with tool vendors or internal process teams to make the measurement recipe, measure repeatability and measure stability to check the equipment measurement capability. Develop skills for data collection and analysis, and transfer new tech-node from the TD team. Develop recipes and applications that can quantify semiconductor processing and develop statistical process control methods.

Work with new metrology tools and strategies to drive towards earlier or more efficient data collection methods. Recognize, identify, and raise awareness of process anomalies. Build and improve techniques and identify new ways to use existing tools to quantify relevant process issues. Collaborate with the global network to develop best known methods and maintain alignment between sites. Develop techniques across various metrology platforms including electron beam systems, optical systems, x-ray methods, etc.

Support experimentation, data analysis, and baseline health metrics as well as partnering with others in Technical Development and High Volume Manufacturing. Use state-of-the-art Metrology Inspection equipment and processes to troubleshoot and measure and monitor line health. Develop measurement techniques and recipes to quantify the performance of wafer fabrication. Utilize metrology equipment and applications as well as data analysis skills to visualize and quantify processes.

Collaborate with engineers in process integration, process development, data science, and yield analysis within the ID1 facility.

Qualifications

Employer will accept a Master’s degree in Electrical Engineering, Chemical Engineering, Materials Science and Engineering, or related field and 3 years of experience in the job offered or in a Metrology Application Engineer-related occupation.

• Providing high-end metrology solutions to industry-wide GAP layers for CD, Tilt, Overlay, recess measurement of HAR structures;
• Driving projects to improve tool capabilities for systems, software, and services, delivering quick and efficient results;
• Developing metrology applications on high-tech X-ray and other metrology tools for the DRAM process;
• Developing and applying BKMs for optimum throughput and performance of the tool;
• Metro tool development, demo, evaluation, and alignment of success criteria with the area vendors;
• Matching of tools, recipe and application transfer from HVM FAB to HVM FAB and from Tool to Tool;
• Driving CIP projects to improve tool capabilities for systems, software, and services, delivering quick and efficient results.

As a world leader in the semiconductor industry, Micron is dedicated to your personal wellbeing and professional growth. Micron benefits are designed to help you stay well, provide peace of mind and help you prepare for the future. We offer a choice of medical, dental and vision plans in all locations enabling team members to select the plans that best meet their family healthcare needs and budget.

Micron also provides benefit programs that help protect your income if you are unable to work due to illness or injury, and paid family leave. Additionally, Micron benefits include a robust paid time-off program and paid holidays. For additional information regarding the Benefit programs available, please see the Benefits Guide posted on

Micron is proud to be an equal opportunity workplace and is an affirmative action employer. All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, age, national origin, citizenship status, disability, protected veteran status, gender identity or any other factor protected by applicable federal, state, or local laws.

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