HIL Test Engineer; Automotive

Experience: 3–5 Years

Location: Dearborn, MI

Client: Ford

We are seeking a skilled HIL Test Engineer with 3 to 5 years of experience in automotive testing. The ideal candidate will have strong hands‑on expertise in Hardware‑in‑the‑Loop (HIL) testing, test bench setup, model‑based development, and automation, along with solid experience in dSpace and MATLAB/Simulink environments.

• Perform Hardware‑in‑the‑Loop (HIL) testing for automotive systems to validate functionality and performance.
• Work with Power Net test benches for manual test execution and development of automated test procedures.
• Develop, execute, and maintain test cases and automated test scripts.
• Set up and operate bench‑level HIL systems using dSpace tools
  .
• Create and manage test scenarios, test cases, and reports using Test Rail
  .
• Utilize MATLAB and Simulink for model‑based development, simulation, and validation.
• Work with Simulink models for HIL testing, signal processing, and system behavior analysis.
• Perform CAN and LIN communication verification during integration and testing activities.
• Analyze test results, identify defects, and collaborate with development teams for resolution.
• Support continuous improvement of test processes and automation frameworks.

• 3–5 years of experience in Automotive HIL Testing
  .
• Strong hands‑on experience with dSpace HIL systems
  .
• Experience with Power Net test benches
  .
• Hands‑on experience with MATLAB and Simulink for model‑based development and testing.
• Experience in manual and automated testing methodologies
  .
• Proficiency in Test Rail for test management.
• Knowledge of CAN and LIN communication protocols
  .
• Good understanding of automotive embedded systems.

• Experience with Python or MATLAB scripting for automation.
• Familiarity with tools like CANalyzer, CANape
  , or similar.
• Exposure to system‑level validation and integration testing.

• Bachelor’s Degree in Electronics, Electrical, Automotive Engineering
  , or related field.