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Nanofabrication and metrology specialist

Job in Gaithersburg, Montgomery County, Maryland, 20883, USA
Listing for: Physics World
Full Time position
Listed on 2026-02-12
Job specializations:
  • Engineering
    Research Scientist, Quality Engineering
Salary/Wage Range or Industry Benchmark: 80000 - 100000 USD Yearly USD 80000.00 100000.00 YEAR
Job Description & How to Apply Below

The Scanning Probe Microscopy program in the Physical Measurement Laboratory of NIST is seeking to identify U.S. citizens who may be available for ongoing projects focused on nanofabrication and metrology. This work aims to develop processes for fabricating novel materials and structures, with the goal of characterizing and analyzing the fundamental physics of these systems. For more information about the group, see: https://(Use the "Apply for this Job" box below).

The full list of skills needed for this project is provided below. In your correspondence, please specify the skills that you satisfy, and the skills for which training will be necessary.
US citizenship is required.

The National Institute of Standards and Technology (NIST) is a non-regulatory federal agency within the U.S. Department of Commerce. Its mission is to promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology. This position is for the campus located in Gaithersburg, Maryland, located in the Washington, DC area.

Required Education

PhD in experimental physics

Required Skills
  • Five years of experience in fabricating nanoscale patterns at complex oxide interfaces using conductive atomic force microscopy (c-AFM) and ultra-low voltage electron beam lithography (ULV-EBL).
  • Three years of experience in nanoscale patterning of ferroelectric materials, using ultra-low voltage electron beam lithography.
  • Five years of experience in cleanroom-based nanofabrication of nanoelectronics and quantum devices, including layout design, fume hood, resist-based lithography (photolithography and electron-beam lithography), thin-film deposition and etching.
  • Three years of experience in fabricating two-dimensional layered material devices, including graphene and hexagonal boron nitride heterostructures stacking and transferring.
  • Five years of experience in electrical transport measurements at ultra-low temperatures.
  • Five years of experience in radio frequency (RF) measurements at ultra-low temperatures.
  • Five years of experience in the maintenance and operation of a dilution refrigerator.
  • Five years of experience in handling cryogens, including liquid helium transfer.
  • Experience in operating a multi-modal measurements scanning probe system, including STM, AFM, and electrical transport measurements in a single system operating at ultra-low temperatures and in ultra-high vacuum.
  • Experience in the preparation of atomically sharp probe tips for STM and AFM measurements.
  • Experience with ultra-high vacuum (UHV) techniques, including assembly, types of UHV pumps, in-situ ion sputtering, and reflection high-energy electron diffraction (RHEED) measurements.
  • Experience in dilute atom evaporation in UHV for SPM experiments on single isolated deposited atoms.
  • Five years of experience in research of complex oxide physics, including in La Al O3 /Sr Ti O3  (LAO/STO) heterostructures, with a least three peer-reviewed publications.
  • Three years of experience in research of 2D quantum materials, including graphene-based heterostructures and related van der Waals materials.
  • Research experience in superconducting materials.
  • Research experience with SPM probe-based superconducting Josephson junctions.
  • Five years of experience in developing and programming LabVIEW VIs for electrical transport measurements and spectroscopic mapping of STM and AFM measurements on the Nanonis SPM control system platform.
  • Five years of experience in developing and programming LabVIEW Vis for general instrument control and transport measurements.
  • Five years of experience in Python programming for instrumentation control and data analysis.
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