Postdoctoral Position - Photonics and Optomechanics

The Photonics and Optomechanics Group at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD, USA is seeking multiple postdoctoral scholars to carry out research in photonic integrated circuits, optical metasurfaces, optomechanics, micro and nano electromechanical systems, and associated precision measurement, quantum information and future computing applications. Available research opportunities include development of microfabrication processes and novel devices, advancing transduction principles and their fundamental limits, and development of precision sensing and other applications of microfabricated circuits, transducers and systems.

The group https://(Use the "Apply for this Job" box below). offers a highly collaborative environment with projects and interactions spanning multiple labs within the group, across NIST and externally.

Candidates should have a PhD in physics, electrical engineering, mechanical engineering or a related discipline, a demonstrated scientific track record and hands-on expertise in some of the following areas:

• Integrated linear and nonlinear photonics and integrated electro-optics.
• Optical metasurfaces and integrated photonics for coupling to extended free-space optical modes, in particular, microfabricated optical interfaces to atomic systems.
• Miniature and microfabricated optical cavities, high Q optical and micro and nano-mechanical resonators for precision sensing, laser locking, optical comb spectroscopy, cavity optomechanics, integrated optomechanical transducers, optical particle trapping and related measurement techniques.
• Relevant skills include understanding of fundamental principles, design, optimization, computational electromagnetic, mechanical and thermal modeling, layout generation, nanofabrication, laboratory characterization and application development.
• Experiment automation, measurement optimization, hardware and software development for collection and processing of large data sets.
• Determining fundamental and technical limits of a measurement, using principles such as the Cramer Rao bound and Fisher information, Gaussian process, Kalman filter, and state estimation, particularly in the contexts of optimized photonic metrology, scanning electron microscopy, atomic force microscopy and scanning impulse-response metrology techniques.

US citizenship is preferred.

Interested candidates should send their CV and a brief statement of research experience and interests to the Group Leader listed on the Group web page.

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