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Postdoc in Nanoscale SEM Metrology & Simulation
Job in
Gaithersburg, Montgomery County, Maryland, 20883, USA
Listed on 2026-06-21
Listing for:
Microscopy Society of America
Full Time
position Listed on 2026-06-21
Job specializations:
-
Research/Development
Research Scientist
Job Description & How to Apply Below
The Microscopy Society of America, through the NIST CHIPS Metrology Program, is seeking a motivated postdoctoral researcher to enhance the accuracy of nanoscale measurements using scanning electron microscopy (SEM). This role involves leading the measurement of electron yields with an ultra-high vacuum (UHV) system, while ensuring precise data analysis and instrument maintenance.
Applicants should hold a PhD in Physics, Applied Physics, or a related field, with demonstrated skills in LabVIEW and UHV systems. The project is well-funded through September 2027, seeking candidates who can contribute effectively and quickly.
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