Postdoctoral Fellow; PREP

PREP Research Associate (CHIPS Funded Project)

Position within the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP) to support research in nanometer‑scale planar reference materials, focusing on characterizing thin films of interest to the semiconductor community.

• Plan and conduct research on advanced X‑ray metrologies to determine structural (physical and chemical) properties of blanket thin films on Si and SiC wafers.
• Use lab‑based and synchrotron X‑ray characterization methods for thin‑film samples.
• Apply open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and integrate these properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials.
• Publish results in archival scientific journals and present at topical meetings.

• Ph.D. in physics, materials science, or related field.
• Background in X‑ray measurement techniques (X‑ray reflectivity, X‑ray fluorescence, or X‑ray photoelectron spectroscopy).
• Experience in programming and/or data modeling using Python.
• Familiarity with thin‑film deposition and clean‑room access protocols preferred.
• Strong oral and written communication skills.

U.S. Citizens preferred.

Salary range determined by Johns Hopkins University, commensurate with experience. Total rewards include health, life, career, and retirement benefits. More information: .

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