Postdoctoral Fellow (PREP0004225
Listed on 2026-08-22
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Research/Development
Research Scientist
PREP Research Associate
CHIPS Funded Project.
Research
Title:
Nanometer-Scale Planar Reference Materials (U.S. Citizens Preferred)
The Material Measurement Laboratory of the National Institute of Standards and Technology (NIST) seeks qualified individuals (U.S. Citizens preferred) to join the NIST/CHIPS Nanometer-Scale Planar Reference Materials project. The role involves advanced metrology methods to characterize local physical and chemical properties and map variations in thin, nanometer‑scale films deposited on Si and SiC wafers.
Key Responsibilities- Plan and conduct research on advanced X‑ray metrology to determine the structural (physical and chemical) properties of blanket (non‑patterned) thin films on Si and SiC wafers.
- Use lab‑based and synchrotron X‑ray characterization methods to determine structural properties of thin film samples.
- Use open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
- Perform wafer dicing, cleaning, and packaging of samples for distribution as research‑grade test materials.
- Publish results in archival scientific journals and present results at topical meetings.
- Ph.D. in physics, materials science, or a related field.
- Background in X‑ray measurement technique(s) (X‑ray reflectivity, X‑ray fluorescence, or X‑ray photoelectron spectroscopy) required.
- Background in programming and/or data modeling using Python recommended.
- Familiarity with thin‑film deposition and clean‑room access protocols preferred.
- Strong oral and written communication skills.
Equal Opportunity Employer
The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students and does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status, or other legally protected characteristics.
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