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Postdoctoral Fellow: Nano-Scale X-Ray Metrology
Job in
Gaithersburg, Montgomery County, Maryland, 20883, USA
Listed on 2026-08-22
Listing for:
Johns Hopkins University
Full Time
position Listed on 2026-08-22
Job specializations:
-
Research/Development
Research Scientist
Job Description & How to Apply Below
Johns Hopkins University in Gaithersburg seeks a Research Associate for the NIST CHIPS project, focusing on advanced X-ray metrology methods to characterize nanometer-scale thin films. Qualified candidates will conduct research, publish findings, and present at conferences.
Applicants must possess a Ph.D. in a relevant field and have experience with X-ray measurement techniques. Strong communication skills are also essential. Join a team that promotes scientific excellence and equal opportunity.
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