Software Manager, Machine Control & Distributed Computing

Company Overview

KLA is a global leader in diversified electronics for the semiconductor manufacturing ecosystem. Virtually every electronic device in the world is produced using our technologies. No laptop, smartphone, wearable device, voice‑controlled gadget, flexible screen, VR device or smart car would have made it into your hands without us. KLA invents systems and solutions for the manufacturing of wafers and reticles, integrated circuits, packaging, printed circuit boards and flat panel displays.

The innovative ideas and devices that are advancing humanity all begin with inspiration, research and development. KLA focuses more than average on innovation and we invest 15% of sales back into R&D. Our expert teams of physicists, engineers, data scientists and problem‑solvers work together with the world’s leading technology providers to accelerate the delivery of tomorrow’s electronic devices. Life here is exciting and our teams thrive on tackling really hard problems.

There is never a dull moment with us.

With over 40 years of semiconductor process control experience, chip makers around the globe rely on KLA to ensure that their fabs ramp next‑generation devices to volume production quickly and cost‑effectively. Enabling the movement towards advanced chip design, KLA’s Global Products Group (GPG), which is responsible for creating all of KLA’s metrology and inspection products, is looking for the best and the brightest research scientist, software engineers, application development engineers, and senior product technology process engineers.

The LS‑SWIFT Division of KLA’s Global Products Group provides patterned wafer inspection systems for high‑volume semiconductor manufacturing. Its mission is to deliver market‑leading cost of ownership in defect detection for a broad range of applications in the production of semiconductors. Customers from the foundry, logic, memory, automotive, MEMS, advanced packaging and other markets rely upon high‑sample wafer inspection information generated by LS‑SWIFT products.

LS (Laser Scanning) systems enable cost‑effective patterned wafer defect detection for the industry’s most sophisticated process technologies deployed in leading‑edge foundry, logic, DRAM, and NAND fabs. SWIFT (Simultaneous Wafer Inspection at Fast Throughput) systems deliver all‑wafer‑surface (frontside, backside, and edge) macro inspection that is critical for automotive IC, MEMS, and advanced packaging processes as well as foundry/logic and memory fabs.

LS‑SWIFT operates from a global footprint that includes the US, Singapore, India and Germany, and serves a worldwide customer base across Asia, Europe and North America.

• Strong understanding of programming skills using high‑level languages: C#, C++, Java, Python
• Strong knowledge of design and architectural patterns
• Good knowledge of open‑source software and varied technologies (web and thick client). Have a good understanding of the strengths and weaknesses of software architectures of these technologies
• Passion for building and nurturing team members and helping them realize full potential
• Rational thinking in arriving at a decision (technical or for project)
• Good technical problem‑solving skills
  
  Functional manager experience is not a prerequisite

• Build and lead a team of smart software engineers to help our wafer inspection products achieve the next level of performance through superior technology and the latest in software practices & machine learning. Bring proven experience in leading a team of engineers to conceive, design and deploy robust/scalable software for high‑volume production and real‑time applications.
• Lead the change to bring in the next‑generation software architecture (in possibly newer tech stack) along with supporting the existing set of features done with the current software tech stack.
• Acquire and demonstrate technical knowledge of LS‑SWIFT product software.
• Meet product timelines with good quality software.
• Work on complex problems where analysis of situations or data requires an in‑depth evaluation of various contributing factors.
• Ensure that…