Materials Analyst, Microscopy

Company Description
 Eurofins EAG Laboratories has almost 50 years of experience in engineering and materials testing services. Our parent company, Eurofins Scientific, is a multi-billion-dollar global leader in engineering and scientific services operating over 950 labs in 60 countries with 65,000 employees with a portfolio of over 200,000 validated analytical methods.
 At EAG, curiosity fuels everything we do. Every analysis, every test, and every question asked in our labs helps unlock what materials and products are capable of—and what the world can build next. If you’re energized by materials science, analytical chemistry, engineering rigor, and solving problems that matter, you’ll feel right at home here.
 Every analysis, every test, and every question asked in our labs helps unlock what materials and products are capable of—and what the world can build next. If you’re energized by materials science, analytical chemistry, and engineering rigor, you’ll feel right at home here.
 Our scientists and engineers support industries ranging from semiconductors and advanced electronics to pharmaceuticals, medical devices, energy systems, and consumer products. Using advanced techniques in analytical chemistry, microscopy, surface analysis, and engineering sciences, we help clients solve complex challenges across the product lifecycle.
 What sets EAG apart isn’t just our world‑class instrumentation—it’s our people. We’re problem solvers, collaborators, and lifelong learners who value precision, curiosity, and impact. Here, your work directly influences the safety, reliability, and performance of products used around the globe.
 Imagine the possibilities. Let’s explore them together.

Job Description
 Join our growing Advanced Microscopy team in Phoenix, AZ and help shape the success of our state-of the-art laboratory. We are seeking a Materials Analyst to join our specialized Dual Beam (SEM-FIB) group, supporting advanced materials and semiconductor analysis for clients across a wide range of industries.
 This hands-on role focuses on TEM lamella preparation using Dual Beam FIB tools and offers the opportunity to work with cutting-edge instrumentation. As a key member of the team, you will contribute to high-impact client projects by producing quality, site-specific TEM samples that enable advanced failure analysis and materials characterization.
 The successful candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast-paced laboratory environment, and takes pride in delivering quality and timely results for clients.
 What You’ll Do
 A typical day in this role includes:
 Preparing high‑quality, site‑specific TEM lamella using Dual Beam FIB‑SEM systems on novel materials and advanced semiconductor devices.
 Performing SEM imaging to support sample navigation, preparation, and quality verification.
 Managing multiple client samples, ensuring adherence to internal quality standards and turnaround commitments.
 Working closely with your team to optimize workflows, improve efficiency, and maintain consistent output.
 Collaborating with internal analytical teams and, as needed, clients to understand analysis requirements and standardized procedures.

Work Schedule:

Sundays to Thursdays,
* 5pm-2am (
* 10% evening shift differential will apply)
 Compliance Requirement (ITAR)
 This position supports work related to defense applications and is subject to ITAR regulations.
 Applicants must be U.S. Persons, defined as:
 U.S. Citizen
 U.S. Permanent Resident (Green Card holder)
 Political Asylee or Refugee
 Qualifications
 This role is structured for BS to MS level only or equivalent industry backgrounds and is not aligned with PhD‑level graduate level.
 B.S. or M.S. in Materials Science & Engineering or related field, or equivalent hands‑on industry experience.
 Hands‑on experience operating Dual Beam FIB‑SEM systems, OR strong academic / early‑industry exposure with demonstrated capability to independently execute sample preparation workflows.
 Working knowledge of electron microscopy principles (SEM/TEM).
 General understanding of…