Materials Analyst Microscopy Dual Beam FIB

Job Description

Join our growing Advanced Microscopy team in Phoenix, AZ and help shape the success of our state-of the-art laboratory. We are seeking a Materials Analyst to join our specialized Dual Beam (SEM-FIB) group, supporting advanced materials and semiconductor analysis for clients across a wide range of industries.

This hands-on role focuses on TEM lamella preparation using Dual Beam FIB tools and offers the opportunity to work with cutting-edge instrumentation. As a key member of the team, you will contribute to high-impact client projects by producing quality, site‑specific TEM samples that enable advanced failure analysis and materials characterization.

The successful candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast‑paced laboratory environment, and takes pride in delivering quality and timely results for clients.

A typical day in this role includes:

• Preparing
  **** high‑quality, site‑specific TEM lamella using Dual Beam FIB‑SEM systems on novel materials and advanced semiconductor devices.
• Performing SEM imaging to support sample navigation, preparation, and quality verification.
• Managing multiple client samples, ensuring adherence to internal quality standards and turnaround commitments.
• Working closely with your team to optimize workflows, improve efficiency, and maintain consistent output.
• Collaborating with internal analytical teams and, as needed, clients to understand analysis requirements and standardized procedures.

Work Schedule:

* Sundays to Thursdays, 5pm-2am (
* 10% evening shift differential will apply)

This position supports work related to defense applications and is subject to ITAR regulations.

Applicants must be U.S. Persons, defined as:

• U.S. Citizen
• U.S. Permanent Resident (Green Card holder)
• Political Asylee or Refugee

• B.S. or M.S. in Materials Science & Engineering or related field
  , or equivalent hands‑on industry experience. This role is structured for BS to MS level only or equivalent industry backgrounds and is not aligned with PhD‑level graduate level.
• Hands‑on experience operating Dual Beam FIB‑SEM systems , OR strong academic / early‑industry exposure with demonstrated capability to independently execute sample preparation workflows.
• Working knowledge of electron microscopy principles (SEM/TEM).
• General understanding of semiconductor device physics and failure analysis concepts gained through coursework, lab work, or prior industry experience.
• Strong problem‑solving skills and the ability to manage priorities in a fast‑paced, deadline‑driven lab environment.

• Demonstrated expertise in TEM lamella preparation , including lift‑out and site‑specific techniques.
• Advanced SEM imaging experience.
• Prior experience supporting high‑throughput or production laboratory environments.
• Clear, timely technical communication with internal teams and external clients.

• Extensive, uninterrupted hands‑on tool time.
• Exposure to a wide range of advanced materials and semiconductor technologies.
• A collaborative team culture focused on technical excellence and continuous improvement.
• Evening shift structure that supports deep focus and accelerated technical mastery.

• The person in this position needs to occasionally move about inside the office or laboratory to access file cabinets, machinery, equipment etc.
• Ability to continuously operate a personal computer or lab equipment for extended periods of time (4 or more hours).
• Physical dexterity sufficient to use hands, arms, and shoulders repetitively to operate a keyboard and other lab equipment, use a telephone, access file cabinets and other items stored at…