Packaging Engineer- Bump Interconnect

We’re seeking an experienced engineer to lead bump interconnect development for advanced semiconductor devices (2.5D/3D/chiplet/fan-out).

This role spans ubump and C4 bump metallurgy, RDL design and

plating, chip-side and interposer capture pad design rules, OSAT engagement, reliability,

failure analysis,and cross-functional support through package and system productization.

• Own end-to-end bump interconnect development for both ubump (micro-bump) and C4 processes, including bump formation, and reflow for use with mass reflow, TCB, and LAB chip attach for high-performance semiconductor packages.
• Define and own bump metallurgy stacks for ubump (e.g., Cu pillar/SnAg) and C4 (e.g., SAC alloys) interconnects, including UBM selection and pad finish specifications for both chip-side and interposer capture pads.
• Develop and own design rules for bump interconnects including pitch, bump diameter, standoff height, keep-outs, and land pad geometry for both the chip side and interposer or substrate.
• Lead RDL (redistribution layer) process development including electroplating of Cu RDL traces, via fills, and pad finishes; define RDL design rules for line/space, via diameter, and layer stack-up to meet electrical and reliability requirements.
• Collaborate with OSATs and bumping foundries to qualify ubump and C4 bumping processes, drive design rule alignment, and manage process transfers into production.
• Evaluate and mitigate bump interconnect assembly risks including non-wet opens, voiding, head-in-pillow, intermetallic growth, and joint fatigue failures across both ubump and C4 interconnect types.
• Perform root cause analysis of assembly and reliability failures using cross-sectioning, SEM, CSAM, and other failure analysis techniques.
• Support reliability qualification including thermal cycling, drop, mechanical shock, and power cycling.
• Work cross-functionally with design, reliability, thermal, and manufacturing teams to ensure robust package performance from concept through high-volume production.

• Strong experience in bump interconnect processes including ubump (Cu pillar, micro-bump) and deep understanding of bumping metallurgy including UBM stacks, solder alloy systems (SnAg), intermetallic compound (IMC) formation and growth kinetics, and their impact on joint reliability.
• Experience with RDL plating processes including Cu electroplating, photoresist patterning, seed layer deposition, and associated design rules for line/space, via geometry, and pad stack.
• Understanding of thermo-mechanical behavior in bump interconnect assemblies including CTE mismatch, warpage, solder joint fatigue, and IMC-driven reliability risks for both ubump and C4 configurations.
• Hands-on experience with failure analysis and reliability testing (cross-sections, SEM, CSAM, thermal cycling).
• Ability to work with OSATs and suppliers to develop and transfer assembly processes into production.
• Strong problem-solving skills with ability to debug yield and reliability issues in manufacturing.

• Experience with III-V packaging, photonics packaging, and precision chip attach.
• Experience with advanced packaging technologies including 2.5D interposers, 3D stacking, chiplets, and CoWoS-like architectures.
• Familiarity with fine-pitch micro-bump and hybrid bonding approaches.
• Experience integrating high-power or high-TDP devices with tight warpage and thermal constraints.
• Exposure to thermo-mechanical modeling or collaboration with simulation teams for warpage and reliability prediction.
• Understanding of system-level interactions (warpage, second-level interconnect reliability).
• Deep expertise in bump metallurgy fundamentals including UBM stack design (Ti/Cu, etc.), solder alloy selection, wetting behavior, and the influence of plating chemistry and process conditions on bump morphology and composition.
• Fundamental knowledge of intermetallic compound (IMC) formation, growth kinetics, and phase behavior in Cu/Sn, Ni/Sn, and Au/Sn systems; understanding of how IMC thickness, morphology, and composition affect joint strength, electromigration resistance, and long-term reliability.

Industry experience in semiconductor packaging with strong emphasis on bump interconnect processes, RDL development, and productization.