Senior​/CHAR Engineer

Overview

At PDF Solutions, we are at the forefront of revolutionizing the semiconductor industry. Our cutting‑edge technologies and data‑driven solutions empower semiconductor manufacturers to achieve unprecedented levels of efficiency, quality, and innovation. By joining our team, you'll have the opportunity to work with some of the brightest minds in the industry, tackle complex challenges, and contribute to groundbreaking advancements that shape the future of technology.

Headquartered in Santa Clara, California, PDF Solutions also operates worldwide in Canada, China, France, Germany, Italy, Japan, Korea, and Taiwan.

Provide accurate, thorough, and timely electrical characterization (CHAR) data analysis to support client teams in resolving yield, performance, and reliability challenges. Leverage deep device and parametric analysis expertise to identify root causes and drive actionable insights, while contributing to the continuous enhancement of analysis methodologies and technical capabilities within PDF Solutions.

• Partner with cross‑functional teams (device engineering, test, yield, and customer‑facing consultants) to define data sources, characterization objectives, analysis methodologies, and deliverable formats aligned to project timelines.
• Apply and continuously refine standardized electrical characterization and parametric analysis methodologies while adapting to technology node, device architecture, and customer‑specific requirements.
• Analyze and interpret parametric test data (e.g., IV, CV, reliability, variability metrics), identifying sources of variation across process, design, test conditions, and data integrity. Proactively troubleshoot data anomalies including probe/test issues, data pipeline errors, and process‑induced variability.
• Collaborate closely with test engineers, product engineers, and design teams to debug silicon issues, validate test structures, and ensure data quality and measurement accuracy.
• Develop, customize, and optimize analysis workflows, scripts, and reporting templates (e.g., JMP, Python, MATLAB) to improve efficiency, scalability, and repeatability of characterization analysis.
• Perform rigorous quality checks on analysis outputs to ensure technical accuracy, statistical relevance, and clarity of insights for engineering and customer stakeholders.
• Benchmark results against historical data, baseline models, and expected device behavior; identify deviations, trends, and early indicators of yield or reliability risks.
• Synthesize complex datasets into clear, actionable insights and communicate findings through well‑structured reports and presentations to internal teams and external clients.
• Lead or support advanced analyses including DOE (Design of Experiments), correlation studies across multiple data sources (fab, test, reliability), and time‑based performance tracking.

• Electrical Characterization (CHAR) Expertise – strong hands‑on experience with parametric test data (IV, CV, Idsat, Vt, leakage, variability, reliability) and deep understanding of device behavior across silicon.
• Semiconductor Device Physics & Process Knowledge – solid grounding in MOSFET/device physics and process integration, with the ability to link electrical signatures to process variations and yield impact.
• Advanced Data Analysis & Statistics – proven capability in statistical analysis, variability characterization, and Design of Experiments (DOE) to diagnose complex yield and performance issues.
• Programming & Data Tools – proficiency in tools such as Python, JMP, MATLAB, or similar for data mining, automation, and large dataset analysis.
• Root Cause Analysis & Debugging – demonstrated ability to troubleshoot electrical anomalies across test, probe, and process domains; isolate root causes and drive resolution.
• Cross‑Functional Collaboration – experience working with test, product, yield, and design teams to close the loop between silicon data and engineering actions.
• Data Integrity & Validation – strong attention to data quality, with the ability to identify inconsistencies from test setup, data pipelines, or measurement artifacts.
• Technical Communication – ability to…