Scientist, Atomic Force Microscopy (AFM)​/ Nanoindentation

Scientist, Atomic Force Microscopy (AFM)/ Nanoindentation

EAG Laboratories is seeking a Scientist to join our Materials Characterization team with primary responsibility for operating and interpreting data from Atomic Force Microscopy (AFM), Nanoindentation, and Optical Profilometry (OP) instrumentation.

The ideal candidate will have hands-on experience characterizing mechanical, surface, and nanoscale material properties and be comfortable with all phases of the analytical process, including experimental design, sample preparation, data acquisition, data interpretation, technical reporting, and customer interactions.

This position requires a strong technical foundation in Materials Science, Physics, Chemistry, Mechanical Engineering, or a related field.

A typical day may include:

• Designing analytical approaches to address customer questions and technical challenges.
• Preparing samples and acquiring data using AFM, Nanoindentation, and Optical Profilometry systems.
• Performing advanced surface characterization, topographical analysis, roughness measurements, mechanical property characterization, electrical characterization and nanoscale mapping.
• Working with internal sample preparation teams when cross-sectioning or specialized sample preparation is required.
• Processing, analyzing, and interpreting data to generate meaningful technical conclusions.
• Writing comprehensive scientific reports that clearly communicate methodology, results, and recommendations.
• Presenting findings to customers and internal stakeholders.
• Collaborating with multidisciplinary teams of scientists and engineers on complex investigations

In addition to laboratory work, you will regularly:

• Meet with customers to discuss project goals, results, and future analyses.
• Partner with EAG business development and sales teams to recommend analytical solutions.
• Participate in technical discussions that help customers solve materials, process, and reliability challenges.
• Support proposal development and scope definition for new projects.

Scientists are encouraged to expand their expertise through:

• Development of new analytical methodologies.
• Research and characterization of emerging materials and technologies.
• Publication of technical papers and participation in industry conferences.
• Creation of technical marketing content and application notes.
• Collaboration with instrument manufacturers and service providers.
• Cross-training in complementary surface and materials characterization techniques.

Successful candidates thrive in a fast-paced consulting laboratory environment where multiple projects move simultaneously. They are curious scientists, strong communicators, and collaborative teammates who can independently manage priorities while delivering high-quality scientific results.

Important ITAR Requirement:
Use of information in this role is subject to the International Traffic in Arms Regulations (ITAR). To be considered for this position, applicants must qualify as a U.S. Person under ITAR. A U.S. Person includes:

• U.S. Citizen
• U.S. Permanent Resident (Green Card Holder)
• Political Asylee
• Refugee

Education & Experience:

• PhD in Materials Science, Physics, Chemistry, Mechanical Engineering, or related scientific discipline.
• 1+ years of industrial, academic, or research experience using AFM, Nanoindentation, or related materials characterization techniques.
• Experience designing analytical protocols and conducting independent scientific investigations.
• Experience interpreting experimental data and applying findings to solve practical engineering or materials challenges.
• Experience writing technical reports and communicating scientific results.

Strong preference for experience with:

• Atomic Force Microscopy (AFM), including modes such as SCM, SSRM, sMIM, KPFM, MFM and mechanical testing modes
• Nanoindentation / Nanomechanical testing
• Optical Profilometry / White Light Interferometry
• Surface roughness and topography measurements
• Thin film characterization
• Mechanical and electrical property characterization
• Failure analysis and root cause investigations
• Semiconductor, advanced materials, or microelectronics characterization

Experience with one or more advanced AFM modes is highly desirable:

• PF-QNM (Peak Force Quantitative Nanomechanical Mapping)
• SCM (Scanning Capacitance Microscopy)
• SSRM (Scanning Spreading Resistance Microscopy)
• sMIM (Scanning Microwave Impedance Microscopy)
• Conductive AFM
• Kelvin Probe Force Microscopy (KPFM)

Experience with any of the following techniques is a plus:

• Scanning Electron Microscopy (SEM)
• Focused Ion Beam (FIB) /Dual Beam (DB)
• TEM/STEM
• Raman Spectroscopy
• FTIR
• XPS
• NanoIR
• Materials and surface analysis techniques

Skills &

Competencies:

• Strong analytical and problem-solving skills.
• Excellent written and verbal communication.
• Ability to work independently while collaborating effectively within a team.
• Customer-focused mindset with the ability to communicate complex scientific concepts clearly.
• Strong organizational skills and ability to manage multiple priorities and deadlines.

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